Large-sized Panel Analysis
TSP Simulation
Electrical analysis in TSP may be limited due to the increase in memory usage and simulation time. TRCX offers a convenient and highly flexible algorithm for generating adaptive mesh which is suitable for analyzing the electro-optical properties of TSP including potential distribution and capacitance calculation. The simulation area is partitioned into the unit areas based on the generated mesh then automatically merged by the distributed computing system.
Fingerprint Simulation
Scanning the fingerprint in a large-sized panel is to capture the difference of the capacitance between the ridges and valleys on the fingerprint. To speed up the calculation execution time, the simulation area is partitioned through distributed computing and automatically merged into a result that contains the information of a fingerprint. Engineers can analyze the potential distribution and capacitance contour based on the layout result with a fast and exact simulation algorithm.
RC Simulation(Peripheral Area)-1
The method of calculating the capacitance in peripheral areas is related to maximizing the analyzing performance. Electrodes used in calculating the capacitance will be automatically defined, and the simulation area will be divided by electrodes by a distributed computing system. There are a lot of advantages to using a distributed computing system such as reducing the simulation time and error rates.
RC Simulation(Peripheral Area)-2
Calculating the resistance in peripheral areas is also related to the distributed computing system to reduce the simulation time.
The port numbers for resistance calculation are automatically defined based on the partitioned simulation area.
The results of the calculation show the high accurate properties compared to the reference.
RC Simulation(Driving Circuit)
A large amount of memory and a lot of simulation time are required when calculating the capacitance for the driving part of a display panel which is composed of the complex and multi-layered structures. The simulation area is automatically or manually segmented by the electrode configuration of the driving element, and calculated results will be merged by the distributed computing system. The number of nodes and simulation time will be drastically reduced by the segmented simulation.
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